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Zyvex has a number of application notes and technical papers.
9702:
Four Point Probe I-V Electrical Measurement Using the Zyvex
Test System Employing a Keithley 4200
9703:Using
Microgrippers with the S200
9704:
Powering MEMS Devices Using the S200 Nanomanipulator System
9705:
Measuring Electrical Breakdown of a Dielectric-Filled Trench
Used for Electrical Isolation of Semiconductor Devices
9706:
Mechanical Measurement of Individual Carbon Nanotubes Using
MEMS and the S200 Nanomanipulator
9707:
Physical Property Characterization of Nanotubes, Nanowires,
and Nanocoils Using a S200 Nanomanipulator System
9708:
Probing Transistors at the Contact Level in Integrated Circuits
9710:
Manipulation of Collagen Fibers for Mechanical Characterization
9713:
TEM Sample Lift-out Using the Zyvex Nanoprober System
9719:
Enabling Subcellular Nanosurgery: An Applications Overview
9720:
Directed Cellular Manipulation Using Polymer Microgrippers
9721:
Intracellular Nanosurgery
9723:
Using Zyvex Microgrippers with Zyvex Nanomanipulators
9724:
Force Measurement in an SEM using the Zyvex Force Characterization Package
TP2007.1:
Bit Cell Stability Testing using an Encoded 8-Positioner SEM
Nanoprobing System
TP2007.2:
Measuring Static Noise Margin of 65nm Node SRAMS using a 7-Positioner
SEM Nanoprobing Technique
TP2009.1:
Capacitance-Voltage Testing using a SEM based Nanoprober
TP2009.2:
Nanoprobing SRAM Bit Cells with High Speed Pulses
For more information,
please contact one of our sales representatives at 972.792.1671
or email sales@zyvex.com.
For application notes
on our NanoSolve® Materials, check out the Zyvex Performance
Materials site at: www.zyvexpro.com.
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